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A reader named Anand suggested diagrams for the scan test basics article. I’m happy to oblige. Read the rest of this entry »

The target audience for this article is digital system designers or students who are unfamiliar with basic elements of design for test.

The two essential parameters of an effective test with high fault coverage are controllability and observability. Scan test is a means of increasing both in a sequential digital IC design. Read the rest of this entry »

A great deal of effort is spent in some design teams to achieve high fault coverage test programs in pursuit of enhanced reliability. While this is a laudable goal, one must understand the difference between a fault and a defect to avoid unnecessary and unproductive effort. Read the rest of this entry »